In-situ TEM study of interface sliding and migration in an ultrafine lamellar structure

Materials Research Society Symposium Proceedings

Volumn 880, Issue , 2005, Pages 23-28

  Hsiung, Luke L M ^a   Nieh, T G ^b  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b University of Tennessee   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CREEP; IN SITU PROCESSING; INTERFACES (MATERIALS); TITANIUM ALLOYS; TRANSMISSION ELECTRON MICROSCOPY;

CREEP MECHANISMS; IN-SITU STRAINING TECHNIQUES; INTERFACIAL DISLOCATIONS; ULTRAFINE LAMELLAR TIAL ALLOYS;

LAMELLAR STRUCTURES;

EID: 34249991434     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-880-bb1.9     Document Type: Conference Paper

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