Weak-beam dark-field electron tomography of dislocations in GaN

Journal of Physics: Conference Series

Volumn 26, Issue 1, 2006, Pages 247-250

  Barnard, J S ^a   Sharp, J ^a   Tong, J R ^a   Midgley, P A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33644557119     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/26/1/059     Document Type: Conference Paper

References (9)

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