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Volumn 33, Issue 2, 2008, Pages 83-90
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In Situ Transmission Electron Microscopy
a a a
a
NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
CAMERAS;
COOLING;
ELECTRON OPTICS;
GROWTH KINETICS;
MICROSTRUCTURE;
DYNAMIC MICROSTRUCTURAL CHANGES;
GROWTH ENVIRONMENTS;
STAGE DESIGNS;
TRANSMISSION ELECTRON MICROSCOPY;
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EID: 39849083775
PISSN: 08837694
EISSN: 19381425
Source Type: Journal
DOI: 10.1557/mrs2008.20 Document Type: Article |
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Times cited : (32)
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References (0)
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