Materials science: Embedded nanostructures revealed in three dimensions

Science

Volumn 309, Issue 5744, 2005, Pages 2195-2198

  Arslan, I ^a   Yates, T J V ^a   Browning, N D ^b,c   Midgley, P A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b Davis   (United States)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; SEMICONDUCTOR QUANTUM DOTS; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; VISUALIZATION;

SCANNING TRANSMISSION ELECTRON MICROSCOPY; Z-CONTRAST TOMOGRAPHY;

NANOTECHNOLOGY;

NANOMATERIAL; QUANTUM DOT; SILICON; TIN;

NANOTECHNOLOGY;

ARTICLE; CONTRAST ENHANCEMENT; MATERIALS; MORPHOLOGY; NANOTECHNOLOGY; OPTICAL RESOLUTION; PRIORITY JOURNAL; SCANNING TRANSMISSION ELECTRON MICROSCOPY; THREE DIMENSIONAL IMAGING; THREE DIMENSIONAL STRUCTURE; TOMOGRAPHY; ULTRASTRUCTURE; Z CONTRAST TOMOGRAPHY;

EID: 25844483001     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.1116745     Document Type: Article

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28. This work was supported by the Royal Society and the NSF in the form of fellowships for I.A. We thank J. Barnard, the FEI Company, and P. Moeck for helpful discussions and H. Atwater for the samples. The Engineering and Physical Sciences Research Council, the Cambridge Interdisciplinary Research Collaboration in Nanotechnology, the FEI Company, and the Isaac Newton Trust are thanked for financial assistance. This work was supported in part by the U.S. Department of Energy under grant number DE AC05-03ER46057.