Electron channeling: A problem for X-ray microanalysis in materials science

Microscopy and Microanalysis

Volumn 15, Issue 2, 2009, Pages 83-92

  Meisenkothen, Frederick ^a   Wheeler, Robert ^a   Uchic, Michael D ^a   Kerns, Robert D ^a   Scheltens, Frank J ^a  

^a AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

Anomalous absorption; Anomalous transmission; Channeling; EDS; Electron probe microanalysis; EPMA; Overvoltage; WDS; X ray microanalysis

Indexed keywords

GALLIUM; GALLIUM ARSENIDE; NANOMATERIAL; NICKEL; ORGANOARSENIC DERIVATIVE;

ARTICLE; CHEMISTRY; ELECTRON PROBE MICROANALYSIS; EVALUATION; MATERIALS TESTING; METHODOLOGY; X RAY;

ARSENICALS; ELECTRON PROBE MICROANALYSIS; GALLIUM; MATERIALS TESTING; NANOSTRUCTURES; NICKEL; X-RAYS;

EID: 66349112066     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927609090242     Document Type: Article

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