A methodology for measuring in situ lattice strain of bulk polycrystalline material under cyclic load

Review of Scientific Instruments

Volumn 78, Issue 2, 2007, Pages

  Park, Jun Sang ^a   Revesz, Peter ^b   Kazimirov, Alexander ^b   Miller, Matthew P ^a  

^a Cornell University   (United States)

^b Department of Obstetrics Gynecology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTALLOGRAPHY; CYCLIC LOADS; GRAIN SIZE AND SHAPE; STRAIN MEASUREMENT; SYNCHROTRON RADIATION; SYNCHROTRONS;

LATTICE STRAIN; LOADING CYCLE; SYNCHROTRON X RAY; UNIAXIAL LOADING;

POLYCRYSTALLINE MATERIALS;

COPPER;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; INSTRUMENTATION; METHODOLOGY; PHYSICAL CHEMISTRY; POWDER DIFFRACTION; SYNCHROTRON; X RAY DIFFRACTION;

CHEMISTRY, PHYSICAL; COPPER; CRYSTALLIZATION; POWDER DIFFRACTION; SYNCHROTRONS; X-RAY DIFFRACTION;

EID: 33847690198     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2670463     Document Type: Article

References (24)

1. N. E. Dowling, Mechanical Behavior of Materials, 2nd ed. (Prentice-Hall, Englewood Cliffs, NJ, 1999).
2. N. E. Frost, K. J. Marsh, and L. P. Pook, Metal Fatigue (Dover, New York, 1999).
3. S. Suresh, Fatigue of Materials, 2nd ed. (Cambridge University Press, Cambridge, England, 1998).
4. W. F. Hosford, Mechanical Behavior of Materials (Oxford University Press, New York, 1993).
5. U. Lienert, T. S. Han, J. Almer, P. R. Dawson, T. Leffers, L. Margulies, S. F. Nielsen, H. F. Poulsen, and S. Schmidt, Acta Mater. 52, 4461 (2004).
6. R. Martins, L. Margulies, S. Schmidt, H. F. Poulsen, and T. Leffers, Mater. Sci. Eng., A 387-389, 88 (2004).
7. T. S. Han and P. R. Dawson, Mater. Sci. Eng., A 405, 18 (2005).
8. H. Mecking, U. F. Kocks, and Ch. Hartig, Scr. Mater. 35, 465 (1996).
9. I. C. Noyan and J. B. Cohen, Residual Stress: Measurement by Diffraction and Interpretation (Springer-Verlag, New York, 1987).
10. Society of Experimental Mechanics, Handbook of Measurement of Residual Stresses (Fairmont Press, Lilburn, GA, 1995).
11. B. D. Cullity and S. R. Stock, Elements of X-ray Diffraction, 3rd ed. (Prentice-Hall, Englewood Cliffs, 2001).
12. A. D. Krawitz, Introduction to Diffraction in Materials Science and Engineering (Wiley-Interscience, New York, 2001).
13. A. M. Korsunsky, K. E. Wells, and P. J. Withers, Scr. Mater. 39, 1705 (1998).
14. A. Wanner and D. Dunand, Metall. Mater. Trans. A 31, 2949 (2000).
15. J. V. Bernier, M. P. Miller, and J. -S. Park, in Proceedings of the Second International Conference on Multiscale Materials Modeling, edited by, N. Ghoniem, (UCLA, Los Angeles, CA, 2004).
16. M. P. Miller, J. V. Bernier, J. -S. Park, and A. Kazimirov, Rev. Sci. Instrum. 0034-6748 10.1063/1.2130668 76, 113903 (2005).
17. J. V. Bernier and M. P. Miller, J. Appl. Crystallogr. 39, 358 (2006).
18. http://www.marresearch.com/
19. J. V. Bernier, " On the Use of Diffraction in Quantifying the Structure and Micromechanical State of Poly Crystalline Materials., " Ph.D. dissertation, Cornell University, Ithaca, NY (2005).
20. R. A. Young, The Rietveld Method (Oxford University Press, New York, 2002).
21. P. Lukas and L. Kunz, Int. J. Fatigue 11, 55 (1989).
22. H. MayerCampbell Laird, Mater. Sci. Eng., A 194, 137 (1995).
23. R. J. Morrissey, D. L. McDowell, and T. Nicholas, Int. J. Fatigue 0142-1123 10.1016/S0142-1123(99)00030-4 21, 679 (1999).
24. N. Barton, P. R. Dawson, and M. P. Miller, J. Eng. Mater. Technol. 121, 230 (1999).