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Volumn 468, Issue 4-6, 2009, Pages 107-111

EELS femtosecond resolved in 4D ultrafast electron microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; ENERGY DISSIPATION; GRAPHITE;

EID: 58149391629     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2008.12.027     Document Type: Article
Times cited : (74)

References (27)
  • 12
    • 58149373987 scopus 로고    scopus 로고
    • A.H. Zewail, V. Lobastov, Method and System for Ultrafast Photoelectron Microscope, U.S. Patent 7,154,091 B2, 20050401, 2006.
    • A.H. Zewail, V. Lobastov, Method and System for Ultrafast Photoelectron Microscope, U.S. Patent 7,154,091 B2, 20050401, 2006.
  • 24
    • 0142084742 scopus 로고    scopus 로고
    • Mao W.L., et al. Science 302 (2003) 425
    • (2003) Science , vol.302 , pp. 425
    • Mao, W.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.