Three-dimensional X-ray structural microscopy with submicrometre resolution

Nature

Volumn 415, Issue 6874, 2002, Pages 887-890

  Larson, B C ^a   Yang, Wenge ^a   Ice, G E ^a   Budai, J D ^a   Tischler, J Z ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFORMATION; FUNCTIONALLY GRADED MATERIALS; GRAIN BOUNDARIES; GRAIN GROWTH; POLYCRYSTALLINE MATERIALS; SINGLE CRYSTALS; STRAIN; TOMOGRAPHY; X RAY MICROSCOPES;

X-RAY TOMOGRAPHY;

CRYSTAL MICROSTRUCTURE;

ALUMINUM; SILICON;

CRYSTAL STRUCTURE; THREE-DIMENSIONAL MODELING; X-RAY SPECTROSCOPY;

ANALYTIC METHOD; ARTICLE; CALCULATION; CHEMICAL ANALYSIS; COLOR; CRYSTAL STRUCTURE; DENSITY; DIFFERENTIAL APERTURE X RAY MICROSCOPY; MATHEMATICAL MODEL; MICROSCOPY; OPTICAL RESOLUTION; PRIORITY JOURNAL; STRESS STRAIN RELATIONSHIP; STRUCTURE ANALYSIS; SYNCHROTRON; THREE DIMENSIONAL IMAGING; THREE DIMENSIONAL X RAY STRUCTURAL MICROSCOPY; TOMOGRAPHY;

EID: 0037148873     PISSN: 00280836     EISSN: None     Source Type: Journal    
DOI: 10.1038/415887a     Document Type: Article

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