An electron microscope for the aberration-corrected era

Ultramicroscopy

Volumn 108, Issue 3, 2008, Pages 179-195

  Krivanek, O L ^a   Corbin, G J ^a   Dellby, N ^a   Elston, B F ^a   Keyse, R J ^a   Murfitt, M F ^a   Own, C S ^a   Szilagyi, Z S ^a   Woodruff, J W ^a  

^a Nion Co Kirkland   (United States)

Author keywords

Aberration correction; EELS; HAADF imaging; Sample stage; STEM design

Indexed keywords

DETECTORS; ELECTRON ENERGY LOSS SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATION CORRECTION; HAADF IMAGING; SAMPLE STAGE;

ABERRATIONS;

ARTICLE; COMPUTER PROGRAM; ELECTRON MICROSCOPE; ENERGY TRANSFER; ILLUMINATION; IMAGING SYSTEM; POWER SUPPLY; SCANNING ELECTRON MICROSCOPE;

EID: 38349094811     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.07.010     Document Type: Article

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