The three-dimensional X-ray crystal microscope: A new tool for materials characterization

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 35 A, Issue 7, 2004, Pages 1963-1967

  Liu, Wenjun ^a   Ice, Gene E ^b   Larson, Bennett C ^b   Yang, Wenge ^b   Tischler, Jonathan Z ^b   Budai, John D ^b  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; ELASTICITY; GRAIN BOUNDARIES; NANOSTRUCTURED MATERIALS; NONDESTRUCTIVE EXAMINATION; PLASTICITY; SURFACE PROPERTIES; X RAY MICROSCOPES;

ELASTIC STRAIN TENSOR ELEMENTS; MATERIALS CHARACTERIZATION; MESOSCOPIC MATERIALS STRUCTURE; NANOSCOPIC MATERIALS STRUCTURE; X RAY CRYSTAL MICROSCOPE;

CRYSTALLINE MATERIALS;

EID: 3242881934     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-004-0145-1     Document Type: Article

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