3D microstructural characterization of nickel superalloys via serial-sectioning using a dual beam FIB-SEM

Scripta Materialia

Volumn 55, Issue 1 SPEC. ISS., 2006, Pages 23-28

  Uchic, Michael D ^a   Groeber, Michael A ^b   Dimiduk, Dennis M ^a   Simmons, J P ^a  

^a AIR FORCE RESEARCH LABORATORY   (United States)

^b Ohio State University   (United States)

Author keywords

Focused ion beam (FIB) microscopy; Microstructure

Indexed keywords

CRYSTALLOGRAPHY; ION BEAMS; MORPHOLOGY; NICKEL ALLOYS; SCANNING ELECTRON MICROSCOPY;

DUAL BEAM; FOCUSED ION BEAM (FIB) MICROSCOPY; MICRON; SERIAL-SECTIONING PROCEDURES; SUB-MICRON;

MICROSTRUCTURE;

EID: 33646184563     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2006.02.039     Document Type: Article

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