EBSD-based microscopy: Resolution of dislocation density

Computers, Materials and Continua

Volumn 14, Issue 3, 2009, Pages 183-194

  Adams, Brent L ^a   Kacher, Joshua ^a  

^a NONE

Author keywords

Dislocation density tensor; EBSD; Electron diffraction

Indexed keywords

CIRCUIT SIZE; CROSS CORRELATIONS; DENSITY OF DISLOCATION; DISLOCATION DENSITIES; DISLOCATION DENSITY TENSOR; EBSD; EXPERIMENTAL MEASUREMENTS; HIGH RESOLUTION; STEP SIZE;

SCANNING ELECTRON MICROSCOPY; TENSORS;

ELECTRON DIFFRACTION;

EID: 77954013336     PISSN: 15462218     EISSN: 15462226     Source Type: Journal    
DOI: None     Document Type: Article

References (11)

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