Prospects for realizing a sub-Å sub-eV resolution EFTEM

Ultramicroscopy

Volumn 78, Issue 1-4, 1999, Pages 13-25

  Rose, H ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Aberration correction; Analytical electron microscope; Monochromator; Quadrupole projector; Ultraresolution

Indexed keywords

CONFERENCE PAPER; DEVICE; ELECTROMAGNETIC FIELD; ELECTRON BEAM; ENERGY TRANSFER; FILTER; ILLUMINATION; IMAGE ANALYSIS; OPTICAL INSTRUMENTATION; OPTICAL RESOLUTION; SCANNING ELECTRON MICROSCOPE; TRANSMISSION ELECTRON MICROSCOPY; ULTRASTRUCTURE;

ABERRATIONS; CHARGE COUPLED DEVICES; ELECTRON GUNS; LENSES; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ENERGY FILTERING TRANSMISSION ELECTRON MICROSCOPES (EFTEM); SCANNING TRANSMISSION ELECTRON MICROSCOPES (STEM);

ELECTRON MICROSCOPES;

EID: 0032676443     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00025-X     Document Type: Conference Paper

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