In-situ transmission electron microscopy observations and molecular dynamics simulations of dislocation-defect interactions in ion-irradiated copper

Philosophical Magazine

Volumn 83, Issue 8, 2003, Pages 955-967

  Robach, J S ^a   Robertson, I M ^a   Wirth, B D ^b   Arsenlis, A ^b  

^a University of Illinois at Urbana Champaign   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; GRAIN BOUNDARIES; HARDENING; PLASTICITY; STRESS ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

DEFECT-FREE CHANNELS;

MOLECULAR DYNAMICS;

EID: 0242348640     PISSN: 14786435     EISSN: None     Source Type: Journal    
DOI: 10.1080/0141861031000065329     Document Type: Article

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