Crack tip dislocations revealed by electron tomography in silicon single crystal

Scripta Materialia

Volumn 59, Issue 8, 2008, Pages 901-904

  Tanaka, Masaki ^a   Higashida, Kenji ^a   Kaneko, Kenji ^a,b   Hata, Satoshi ^a   Mitsuhara, Masatoshi ^a  

^a KYUSHU UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Dislocations; Electron tomography; Fracture; Scanning transmission electron microscopy; Transmission electron microscopy

Indexed keywords

COMPUTERIZED TOMOGRAPHY; CRACK PROPAGATION; CRACK TIPS; CRYSTALLOGRAPHY; DIAGNOSTIC RADIOGRAPHY; DISLOCATIONS (CRYSTALS); ELECTRIC IMPEDANCE TOMOGRAPHY; IMAGE ENHANCEMENT; IMAGING TECHNIQUES; MEDICAL IMAGING; NONMETALS; POWDERS; SCANNING ELECTRON MICROSCOPY; SILICON; SILICON WAFERS; THERMOGRAPHY (TEMPERATURE MEASUREMENT); THREE DIMENSIONAL; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

COMPUTED TOMOGRAPHY (CT); CRACK TIP DISLOCATIONS; DARK FIELDS; ELECTRON TOMOGRAPHY (ET); FILTERED BACK PROJECTION (EBP); SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM); SILICON SINGLE CRYSTALS; THREE DIMENSIONAL (3D);

SINGLE CRYSTALS;

EID: 48749086215     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2008.06.042     Document Type: Article

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