Electron tomography of nanoparticle catalysts on porous supports: A new technique based on Rutherford scattering

Journal of Physical Chemistry B

Volumn 105, Issue 33, 2001, Pages 7882-7886

  Weyland, Matthew ^a   Midgley, Paul A ^a   Thomas, John Meurig ^a,b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b DAVY FARADAY RESEARCH LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TOMOGRAPHY;

CATALYST SUPPORTS; POROUS MATERIALS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

NANOSTRUCTURED MATERIALS;

EID: 0035940240     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp011566s     Document Type: Article

References (24)

1. Jefferson, D.A.; Thomas, J.M.; Millward, G.R.; Tsuno, K.; Harriman, A.; Brydson, R. D. Nature 1986, 323, 428.
2. Rice, S.B.; Koo, J.Y.; Disko, M.M.; Treacy, M. M. J. Ultramicroscopy 1990, 34, 108.
3. Ozkaya, D.; Zhou, W.Z.; Thomas, J.M.; Midgley, P.A.; Keast, V.J.; Hermans, S. Catal. Lett. 1999, 60, 113.
4. Sinfelt, J. H. Bimetallic Catalysts; J. Wiley: New York, 1983.
5. Thomas, J. M. Angew. Chem., Int. Ed. Engl. 1999, 38, 3589.
6. Houndsfield, G. Les Prix Nobel en 1979; Nobel Foundation: Stockholm, 1979; p 188.
7. Treacy, M.M.J.; Howie, A. J. Catal. 1980, 63, 265.
8. Howie, A. J. Microscopy 1979, 177, 1.
9. Pennycook, S. J. Ultramicroscopy 1989, 30, 58.
10. Raja, R.; Sankar, G.; Hermans, S.; Shephard, D.S.; Bromley, S.; Thomas, J.M.; Johnson, B.F.G.; Maschmeyer, T. Chem. Commun.s 1999, 1571.
11. Crowther, R.A.; Amos, L.A.; Finch, J.T.; Klug, A. Nature 1970, 226, 421.
12. Radon, J. Ber. Verh. K. Saechs. Akad. Wiss. Leipzig, Math.-Phys. Kl. 1917, 69, 262.
13. De Rosier, D.J.; Klug, A. Nature 1968, 217, 130.
14. Koster, A.J.; Ziese, U.; Verkleij, A.J.; Janssen, A.H.; de Jong, K.P. J. Phys. Chem. B 2000, 104, 9368.
15. Janssen, A.H.; Koster, A.J.; de Jong, K. P. Angew. Chem., Int. Ed. Eng. 2001, 40, 1102.
16. Radermacher, M. J. Electron Microsc. Tech. 1988, 9, 359.
17. Frank, J. Electron Tomography: Three-dimensional Imaging with the Transmission Electron Microscope; Plenum Press: New York, 1992.
18. We thank Dr Ron Broom for his help and expertise in modifying the holder.
19. Crowther, R.A.; de Rosier, D.J.; Klug, A. Proc. R. Soc. London., Ser. A 1970, 317, 319.
20. Russ, J.C. The Image Processing Handbook, 3rd ed.; IEEE Press: Piscataway, 2000.
21. American Chemical Society web site: http://pubs.acs.org.
22. Department of Materials Science and Metallurgy Electron Microscopy Group: http://www-hrem.msm.cam,ac.uk/~mw259/Work/Tomo.html.
23. The multilevel voxel (3D pixel) projection is achieved by contrast-selecting intensities from the reconstruction and assigning them definite colour and opacity values.
24. Ramesh, K.S.; Misono, M.; Gai, P. L. Catalyst Materials for High-Temperature Processes; The American Ceramics Society; Westerville, 2001.