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Volumn 90, Issue 11, 2010, Pages 1451-1464

Mesoscale strain measurement in deformed crystals: A comparison of X-ray microdiffraction with electron backscatter diffraction

(6) Field, D P a Magid, K R b Mastorakos, I N a Florando, J N c Lassila, D H c Morris, J W d

a Washington State University (United States)

b ETH ZURICH (Switzerland)

c LAWRENCE LIVERMORE NATIONAL LABORATORY (United States)

d Lawrence Berkeley National Laboratory (United States)

Author keywords

Dislocation density; Electron backscatter diffraction; Residual stress measurement; Synchrotron source; X ray microdiffraction

Indexed keywords

DEFORMED CRYSTALS; DISLOCATION DENSITIES; DISLOCATION DYNAMICS SIMULATION; DISLOCATION STRUCTURES; ELECTRON BACK SCATTER DIFFRACTION; FREE SURFACES; HIGH SPATIAL RESOLUTION; LOCAL ORIENTATION MEASUREMENT; MACROSCOPIC STRAINS; MESOSCALE; NEAR-SURFACE; ORDERS OF MAGNITUDE; SPATIAL RESOLUTION; SPECIMEN SURFACES; SYNCHROTRON SOURCE; TECHNOLOGICAL DEVELOPMENT; X RAY MICRODIFFRACTION; X-RAY TECHNIQUES;

BACKSCATTERING; DISLOCATIONS (CRYSTALS); ELECTRONS; IMAGE RESOLUTION; INSTRUMENTS; RESIDUAL STRESSES; SINGLE CRYSTALS; STRAIN MEASUREMENT; STRESS MEASUREMENT; SURFACE STRUCTURE; SYNCHROTRONS; TECHNOLOGICAL FORECASTING; X RAY DIFFRACTION; X RAYS;

ELECTRON DIFFRACTION;

EID: 77951161013 PISSN: 14786435 EISSN: 14786443 Source Type: Journal
DOI: 10.1080/14786430903397297 Document Type: Article

Times cited : (25)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.