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Volumn 42, Issue 4, 1998, Pages 260-269

Controlled environment transmission electron microscopy

Author keywords

Controlled environment; TEM; Transmission electron microscopy

Indexed keywords

CONTROLLED ENVIRONMENT; GAS SOLID INTERACTION; HIGH SPATIAL RESOLUTION; REAL- TIME; TEM;

EID: 0032529069     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0029(19980915)42:4<260::AID-JEMT5>3.0.CO;2-U     Document Type: Article
Times cited : (33)

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