Ultrafast electron crystallography. 1. Nonequilibrium dynamics of nanometer-scale structures

Journal of Physical Chemistry C

Volumn 111, Issue 13, 2007, Pages 4889-4919

  Yang, Ding Shyue ^a   Gedik, Nuh ^a   Zewail, Ahmed H ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NONEQUILIBRIUM DYNAMICS; TEMPORAL RESOLUTION; ULTRAFAST ELECTRON CRYSTALLOGRAPHY (UEC);

ACOUSTIC WAVES; LATTICE CONSTANTS; NANOSTRUCTURED MATERIALS; OPTICAL RESOLVING POWER; PHOSPHOLIPIDS; VIBRATIONS (MECHANICAL);

CRYSTALLOGRAPHY;

EID: 34247525544     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp067466+     Document Type: Article

References (72)

1. Zewail, A. H. Annu. Rev. Phys. Chem. 2006, 57, 65 and references therein.
2. Srinivasan, R.; Lobastov, V. A.; Ruan, C.-Y.; Zewail, A. H. Helv. Chim. Acta 2003, 86, 1763.
3. Ruan, C.-Y.; Vigliotti, F.; Lobastov, V. A.; Chen, S.; Zewail, A. H. Proc: Natl. Acad. Sci. U.S.A. 2004, 101, 1123.
4. Vigliotti, F.; Chen, S.; Ruan, C.-Y.; Lobastov, V. A.; Zewail, A. H. Angew. Chem., Int. Ed. 2004, 43, 2705.
5. Ruan, C.-Y.; Lobastov, V. A.; Vigliotti, F.; Chen, S.; Zewail, A. H. Science 2004, 304, 80.
6. Ruan, C.-Y.; Yang, D.-S.; Zewail, A. H. J. Am. Chem. Soc. 2004, 126, 12797.
7. Chen, S.; Seidel, M. T.; Zewail, A. H. Proc. Natl. Acad. Sci. U.S.A. 2005, 102, 8854.
8. Chen, S.; Seidel, M. T.; Zewail, A. H. Angew. Chem. Int. Ed. 2006, 45, 5154.
9. Von der Linde, D. Annu. Rev. Mater. Sci. 1988, 18, 75.
10. Shah, J. Ultrafast Spectroscopy of Semiconductors and Semiconductor Nanostructures, 2nd enlarged ed.; Springer: Berlin, 1999.
11. Ashcroft, N. W.; Mermin, N. D. Solid State Physics; Saunders College Publishing; Fort Worth, TX, 1976; pp 101-108.
12. Wang, Z. L. Reflection Electron Microscopy and Spectroscopy for Surface Analysis; Cambridge University Press: Cambridge, U.K., 1996.
13. Warren, B. E. X-ray Diffraction, Dover ed.; Dover Publications: New York, 1990; pp 38, 253.
14. Vetelino, J. F.; Gaur, S. P.; Mitra, S. S. Phys. Rev. B 1972, 5, 2360.
15. (a) Rousse, A.; Rischel, C.; Gauthier, J.-C. Rev. Mod. Phys. 2001, 73, 17.
16. (b) Bressler, C.; Chergui, M. Chem. Rev. 2004, 104, 1781.
17. (c) Bargheer, M.; Zhavoronkov, N.; Woerner, M.; Elsaesser. T. Chem. Phys. Chem. 2006, 7, 783.
18. Kittel, C. Introduction to Solid State Physics, 7th ed.; John Wiley & Sons. Inc.: New York. 1996; pp 129-131.
19. Adachi, S. Optical Constants of Crystalline and Amorphous Semiconductors: Numerical Data and Graphical Information; Kluwer Academic Publishers: Boston, 1999; pp 221, 225.
20. Sokolowski-Tinten, K.; Blome, C.; Blums, J.; Cavalieri, A.; Dietrich, C.; Turuseviteh, A.; Uschmann, I.; Förster, E.; Kammler, M.; Hornvon-Hoegen, M.; von der Linde, D. Nature 2003, 422, 287.
21. Siwick, B. J.; Dwyer, J. R.; Jordan, R. E.; Miller, R. J. D. Chem. Phys. 2004, 299, 285.
22. Nie, S. H.: Wang, X.; Park, H.; Clinite, R.; Cao, J. Phys. Rev. Lett. 2006, 96, 025901.
23. Williamson, S.; Mourou; G.; Li. J. C. M. Phvs. Rev. Lett. 1984, 52, 2364.
24. Konkar, A.; Lu, S.; Madhukar, A. Nano Lett. 2005, 5, 969.
25. Cavassilas, N.; Aniel, F.; Boujdaria, K.; Fishman, G. Phys. Rev. B 2001, 64, 115207.
26. Levinshtein, M. E.; Rumyantsev, S. L. In Handbook Series on Semiconductor Parameters; Levinshtein. M. E., Rumyantsev, S. L., Shur, M., Eds.; World Scientific: Singapore. 1996.
27. Kang, M.-G.; Sa, S.-H.; Park, H.-H.; Suh, K.-S.; Oh, K.-H. Thin Solid Films 1997, 308-309, 634.
28. (a) Kagunov, M. I.; Lifshitz, I. M.; Tanatarov, L. V. Sov. Phys.-JETP 1957, 4, 173.
29. (b) Anisimov, S. I.; Kapeliovich, B. L.; Perel'man, T. L. Sov. Phys.-JETP 1974, 39, 375.
30. Hohlfeld, J.; Wellershoff, S.-S.: Güdde, J.; Conrad, U.; Jähnke, V.; Matthias, E. Chem. Phys. 2000, 251, 237.
31. Ertl, G. Mu. Catal., Vol 45 2000, 45, 1.
32. Othonos, A. J. Appl. Phys. 1998, 83, 1789.
33. Kash, J. A.; Tsang, J. C.; Hvam, J. M. Phys. Rev. Lett. 1985, 54, 2151.
34. Polland, H.-J.: Rühle, W. W.; Ploog, K.; Tu, C. W. Phys. Rev. B 1987, 36, 7722.
35. Sjodin, T.; Petek, H.; Dai, H.-L. Phys. Rev. Lett. 1998, 81, 5664.
36. Sabbah, A. J.; Riffe, D. M. Phys. Rev. B 2002, 66, 165217.
37. Sundaram, S. K.; Mazur, E. Nat. Mater. 2002, 1, 217.
38. Lee, Y. H.; Chavez.-Pirson, A.; Koch, S. W.; Gibbs, H. M.; Park, S. H.; Morhange. J.; Jeffery, A.; Peyghambarian, N.; Banyai, L.; Gossard, A. C.; Wiegmann, W. Phys. Rev. Lett. 1986, 57. 2446.
39. Blakemore, J. S. J. Appl. Phys. 1982, 53, R123.
40. Kadlec, F.; Němec, H.; Kužel. P. Phys. Rev. B 2004, 70, 125205.
41. Yoffa, E. J. Appl. Phys. Lett. 1980, 36, 37.
42. Young, J. F.; van Driel. H. M. Phys. Rev. B 1982, 26, 2147.
43. Huang, L.; Callan, J. P.; Glezer, E. N.; Mazur, E. Phys. Rev. Lett. 1998, 80, 185.
44. (41 ) Dargys, A.; Kundrotas, J. Hundbook on Physical Properties of Ge, Si, CaAs and InP: Science and Encyclopedia Publishers: Vilnius, Lithuania, 1994.
45. Aspnnes, D. E.; Studna, A. A. Phys. Rev. B 1973, 7, 4605.
46. Alouani, M.; Brey, L.; Christensen. N. E. Phys. Rev. B 1988, 37, 1167.
47. Yofte, A. D. Adv. Phys. 1993, 42, 173.
48. Kash, J. A.; Tsang, J. C. Nonequilibrium Phonons in Semiconductors. In Spectroscopy of Nonequilibriitnt Electrons and Phonons; Shank, C. V. Zakharchenya, B. P., Eds.: North-Holland: Amsterdam, 1992.
49. Von der Linde, D.; Kuhl, J.; Klingenberg, H. Phys. Rev. Lett. 1980, 44, 1505.
50. Baumberg, J. J.; Williams, D. A.; Köhler, K. Phys. Rev. Lett. 1997, 78, 3358.
51. Pennington, D. M.; Harris, C. B. IEEE J. Quantum Electron. 1992, 28, 2523.
52. Shah, J. Hot Carriers in Semiconductor Nanostructures: Physics and Applications; Academic Press: Boston, 1992.
53. Shah, J.; Deveaud, B.; Damen, T. C.; Tsang, W. T.; Gossard, A. C.; Lugli, P. Phys. Rev. Lett. 1987, 59, 2222.
54. Oberli, D. Y.; Shah, J.; Damen, T. C. Phys. Rev. B 1989, 40, 1323.
55. Yoffa, E. J. Phys. Rev. B 1981, 23, 1909.
56. Lindemann, F. A. Phys. Z. 1910, 11, 609.
57. (a) Saeta, P.; Wang, J.-K.; Siegal, Y.; Bloembergen, N.; Mazur, E. Phys. Rev. Lett. 1991, 67, 1023.
58. (b) Bloembergen, N. In AIP Conf. Proc., No. 288 - Laser Ablation: Mechanisms and Applications II: Second International Conference, Knoxville, TN, April 1993; Miller, J. C., Geohegan, D. B., Eds.; American Institute of Physics: New York, 1994; pp 3-10.
59. Lindenberg, A. M.; Larsson, J.; Sokolowski-Tinten, K.; Gaffney, K. J.; Blome, C.; Synnergren, O.; Sheppard, J.; Caleman, C.; MacPhee, A. G.; Weinstein, D.; Lowney, D. P.; Allison, T. K.; Matthews, T.; Falcone, R. W.; Cavalieri, A. L.; Fritz, D. M.; Lee, S. H.; Bucksbaum, P. H.; Reis, D. A.; Rudati, J.; Fuoss, P. H.; Kao, C. C.; Siddons, D. P.; Pahl, R.; Als-Nielsen, J.; Duesterer, S.; Ischebeck, R.; Schlarb, H.; Schulte-Schrepping, H.; Tschentscher, Th.; Schneider, J.; von der Linde, D.; Hignette, O.; Seite, F.; Chapman, H. N.; Lee, R. W.; Hansen, T. N.; Techert, S.; Wark, J. S.; Bergh, M.; Huldt, G.; van der Spoel, D.; Timneanu, N.; Hajdu, J.; Akre, R. A.; Bong, E.; Krejcik, P.; Arthur, J.; Brennan, S.; Luening, K.; Hastings, J. B. Science 2005, 308, 392.
60. Bechtel, J. H. J. Appl. Phys. 1975, 46, 1585.
61. Elsayed-Ali, H. E.; Weber, P. M. Time-resolved Surface Electron Diffraction. In Time-resolved Diffraction; Helliwell, J. R., Rentzepis, P. M., Eds.; Oxford University Press; Oxford, 1997; pp 284.
62. Thomas, J. M. Angew. Chem. Int. Ed. 2004, 43, 2606.
63. (a) Dorset, D. L. Z. Kristallogr. 2003, 218, 237.
64. (b) Dorset, D. L. Acta Cryst. 1996, B52, 753.
65. (c) Electron Crystallography: Novel Approaches for Structure Determination ofNanosized Materials; Weirich, T. E., Lábár, J. L., Zou, X., Eds.; Springer; Dordrecht, The Netherlands, 2006.
66. Baum, P.; Zewail, A. H. Proc. Natl. Acad. Sci. U.S.A. 2006, 103, 16105.
67. Gedik, N.; Yang, D.-S.; Logvenov, G.; Bozovic, I.; Zewail, A. H. (submitted).
68. Thomsen, C.; Grahn, H. T.; Maris, H. J.; Taue. J. Phys. Rev. B 1986, 34, 4129.
69. Yablonovitch, E.; Gmitter, T. J.; Bhat, R. Phys. Rev. Lett. 1988, 61, 2546.
70. Strauss, U.; Ruhle, W. W.; Kohler, K. Appl. Phys. Lett. 1993, 62, 55.
71. Singh, J. Electronic and Optoelectronic Properties of Semiconductor Structures; Cambridge University Press: Cambridge, U.K., 2003; pp 241-243.
72. Harb, M.; Emstorfer, R.; Dartigalongue, T.; Hebeisen, C. T.; Jordan, R. E.; Miller, R. J. D. J. Phys. Chem. B 2006, 110, 25308.