In situ electron backscatter diffraction (EBSD) during the compression of micropillars

Materials Science and Engineering: A

Volumn 527, Issue 16-17, 2010, Pages 4306-4311

  Niederberger, C ^a   Mook, W M ^a   Maeder, X ^a   Michler, J ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

Dislocations; EBSD; Micro compression; Micromechanics; SEM in situ testing; Semiconductor

Indexed keywords

BACKSCATTERING; DISLOCATIONS (CRYSTALS); ELECTRON DIFFRACTION; GALLIUM ARSENIDE; III-V SEMICONDUCTORS; ION BEAMS; UNLOADING;

COMPRESSION EXPERIMENTS; DIFFRACTION MEASUREMENTS; DISLOCATION; ELASTIC BENDING; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; IN-SITU TESTING; MICRO PILLARS; MICROCOMPRESSION; SEM IN SITU TESTING;

SINGLE CRYSTALS;

EID: 77952876651     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2010.03.055     Document Type: Article

References (36)

1. Uchic M.D., Dimiduk D.M., Florando J.N., Nix W.D. Science 2004, 305:986-989.
2. Korte S., Clegg W.J. Scripta Mater. 2009, 60:807-810.
3. Volkert C.A., Lilleodden E.T. Philos. Mag. 2006, 86:5567-5579.
4. Michler J., Wasmer K., Meier S., Östlund F., Leifer K. Appl. Phys. Lett. 2007, 90:043123.
5. Kiener D., Motz C., Dehm G. Mater. Sci. Eng. A 2009, 505:79-87.
6. Mook W.M., Jungk J.M., Cordill M.J., Moody N.R., Sun Y., Xia Y., Gerberich W.W. Z. Metallkd. 2004, 95:416-424.
7. Mook W.M., Nowak J.D., Perrey C.R., Carter C.B., Mukherjee R., Girshick S.L., McMurry P.H., Gerberich W.W. Phys. Rev. B 2007, 75:214112.
8. Mook W.M., Lund M.S., Leighton C., Gerberich W.W. Mater. Sci. Eng. A 2008, 493:12-20.
9. Moser B., Wasmer K., Barbieri L., Michler J. J. Mater. Res. 2007, 22:1004-1011.
10. Ghisleni R., Rzepiejewska-Malyska K., Philippe L., Schwaller P., Michler J. Microsc. Res. Tech. 2009, 72:242-249.
11. Ye J., Mishra R.K., Minor A.M. Scr. Mater. 2008, 59:951-954.
12. Shan Z.W., Li J., Cheng Y.Q., Minor A.M., Syed Asif S.A., Warren O.L., Ma E. Phys. Rev. B 2008, 77:155419.
13. Deneen J., Mook W.M., Minor A.M., Gerberich W.W., Carter C.B. Mater. Sci. 2006, 41:4477-4483.
14. Maaß R., Van Petegem S., Van Swygenhoven H., Derlet P.M., Volkert C.A., Grolimund D. Phys. Rev. Lett. 2007, 99:145505.
15. Maaß R., Van Petegem S., Borca C.N., Van Swygenhoven H. Mater. Sci. Eng. A 2009, 524:40-45.
16. Wasmer K., Wermelinger T., Bidiville A., Spolenak R., Michler J. J. Mater. Res. 2008, 23:3040-3047.
17. Dingley D.J., Randle V. J. Mater. Sci. 1992, 27:4545-4566.
18. Zaafarani N., Raabe D., Singh R.N., Roters F., Zaefferer S. Acta Mater. 2006, 54:1863-1876.
19. Rester M., Motz C., Pippan R. Acta Mater. 2007, 55:6427-6435.
20. Kiener D., Motz C., Dehm G. J. Mater. Sci. 2008, 48:2503-2506.
21. Han J.-H., Oh K.H., Chung Y.-H. Key Eng. Mater. 2003, 233-236:835-840.
22. Mao S.C., Han X.D., Tian Y.B., Luo J.F., Zhang Z., Ji Y., Wub M.H. Mater. Sci. Eng. A 2008, 498:278-282.
23. Deal A., Hooghan T., Eades A. Ultramicroscopy 2008, 108:116-125.
24. Goldstein J.I., Newbury D.E., Joy D.C., Lyman C.E., Echlin P., Lifshin E., Sawyer L., Michael J.R. Scanning Electron Microscopy and X-ray Microanalysis 2003, Kluwer, New York. third ed.
25. Deal A., Tao X., Eades A. Surf. Interface Anal. 2005, 37:1017-1020.
26. Dingley D.J. J. Microsc. 2004, 213:214-224.
27. Wilkinson A.F., Meaden G., Dingley D.J. Ultramicroscopy 2006, 106:307-313.
28. Vaudin M.D., Gerbig Y.B., Stranick S.J., Cook R.F. Appl. Phys. Lett. 2008, 93:193116.
29. Mateescu N., Ferry M., Xu W., Cairney J.M. Mater. Chem. Phys. 2007, 106:142-148.
30. Rzepiejewska-Malyska K.A., Buerki G., Michler J., Major R.C., Cyrankowski E., Asif S.A.S., Warren O.L. J. Mater. Res. 2008, 23:1973-1979.
31. Mook W.M., Niederberger C., Bechelany M., Philippe L., Michler J. Nanotechnology 2010, 21:055701.
32. F. Östlund, R. Ghisleni, P.R. Howie, S. Korte, K. Leifer, W.J. Clegg, J. Michler, Philos. Mag., submitted for publication.
33. Kuesters K.-H., De Cooman B.C., Carter C.B. Philos. Mag. A 1986, 53:141-159.
34. Le Bourhis E., Patriarche G. Acta Mater. 2008, 56:1417-1426.
35. Ning X.J., Perez T., Pirouz P. Philos. Mag. A 1995, 72:837-859.
36. Ning X.J., Huvey N. Philos. Mag. Lett. 1996, 74:241-245.