APT analyses of deuterium-loaded Fe/V multi-layered films

Ultramicroscopy

Volumn 109, Issue 5, 2009, Pages 631-636

  Gemma, R ^a   Al Kassab, T ^a   Kirchheim, R ^a   Pundt, A ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

Atom probe tomography; Diffusion; Hydrogen; Thin films

Indexed keywords

ANALYSIS SURFACES; APPARENT DIFFUSION COEFFICIENTS; ATOM PROBE TOMOGRAPHY; CAPPING LAYERS; CONCENTRATION PROFILES; DIFFUSION PROFILES; HOMOGENEOUS DISTRIBUTIONS; HYDROGEN ENERGY SYSTEMS; MODULATED SYSTEMS; MULTI LAYERS; MULTI-LAYERED; MULTI-LAYERED FILMS; ORDERS OF MAGNITUDES; OXYGEN EXPOSURES; PRESSURE-COMPOSITION ISOTHERMS; STORAGE MEDIAS;

APPROXIMATION THEORY; ATOMS; DEUTERIUM; DIAGNOSTIC RADIOGRAPHY; EXTRAPOLATION; HYDROGEN; HYDROGEN STORAGE; OXYGEN; PALLADIUM; PROBES; SEGREGATION (METALLOGRAPHY); SURFACE DIFFUSION; THIN FILMS; TOMOGRAPHY;

SURFACE SEGREGATION;

DEUTERIUM; IRON; VANADIUM;

ARTICLE; ATOM PROBE TOMOGRAPHY; DIFFUSION; FILM; TEMPERATURE DEPENDENCE; TOMOGRAPHY; X RAY DIFFRACTION;

EID: 62549119965     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.11.005     Document Type: Article

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