Elastic strain tensor measurement using electron backscatter diffraction in the SEM

Journal of Electron Microscopy

Volumn 59, Issue SUPPL. 1, 2010, Pages

  Dingley, David J ^a   Wilkinson, Angus J ^b   Meaden, Graham ^c   Karamched, Phani S ^b  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c BLG Productions   (United Kingdom)

Author keywords

cross correlation; EBSD; nickel base alloy; SEM; strain measurement

Indexed keywords

BACKSCATTERING; CARBIDES; DUCTILE FRACTURE; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; NICKEL ALLOYS; PRECIPITATION (CHEMICAL); STRAIN MEASUREMENT;

CROSS-CORRELATIONS; CRYSTALLOGRAPHIC INFORMATION; ELASTIC STRAIN MEASUREMENT; ELASTIC STRAIN TENSOR; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION TECHNIQUE; NICKEL BASE ALLOYS; STRAINS MEASUREMENTS; ZONE AXIS;

TENSORS;

EID: 77955543118     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfq043     Document Type: Conference Paper

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