Towards 0.1 nm resolution with the first spherically corrected transmission electron microscope

Journal of Electron Microscopy

Volumn 47, Issue 5, 1998, Pages 395-405

  Haider, Maximilian ^a   Rose, Harald ^b   Uhlemann, Stephan ^a   Kabius, Bernd ^c   Urban, Knut ^c  

^a CEOS GmbH   (Germany)

^b DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^c FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Aberration correction; Contrast enhancement; High resolution TEM; Information limit; Point spread function; Reduction of artefacts

Indexed keywords

ABERRATIONS; ASPHERICS; IMAGE ENHANCEMENT; TRANSMISSION ELECTRON MICROSCOPY;

% REDUCTIONS; ABERRATION CORRECTION; CONTRAST ENHANCEMENT; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPES; INFORMATION LIMITS; NM RESOLUTION; POINT-SPREAD FUNCTION; REDUCTION OF ARTIFACT; SPHERICAL ABERRATIONS; TRANSMISSION ELECTRON;

OPTICAL TRANSFER FUNCTION;

EID: 0031797093     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023610     Document Type: Article

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