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Materials Science and Technology

Volumn 22, Issue 11, 2006, Pages 1271-1278

High resolution mapping of strains and rotations using electron backscatter diffraction

(3) Wilkinson, A J a Meaden, G b Dingley, D J c

a UNIVERSITY OF OXFORD (United Kingdom)

b BLG Productions (United Kingdom)

c UNIVERSITY OF BRISTOL (United Kingdom)

Author keywords

Dislocation tensor; EBSD; Fatigue; SiGe; Strain; Stress

Indexed keywords

BACKSCATTERING; CORRELATION METHODS; ERROR ANALYSIS; FUNCTIONS; INTERFACES (MATERIALS); STRAIN; STRESS ANALYSIS; TENSORS;

CROSS-CORRELATION FUNCTIONS; DISLOCATION TENSOR; ELECTRON BACKSCATTER DIFFRACTION (EBSD); ROTATION TENSORS;

ELECTRON DIFFRACTION;

EID: 33751372309 PISSN: 02670836 EISSN: None Source Type: Journal
DOI: 10.1179/174328406X130966 Document Type: Article

Times cited : (297)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.