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Volumn 267, Issue 23-24, 2009, Pages 3652-3662

A review of transmission electron microscopes with in situ ion irradiation

Author keywords

In situ TEM; Ion irradiation; Nuclear materials; Radiation damage; Transmission electron microscopy

Indexed keywords

ATOMIC ENERGY RESEARCH ESTABLISHMENTS; ATOMISTIC PROCESS; CAMBRIDGE; CHEMICAL DISORDER; COLLISION CASCADE; COMPOSITIONAL CHANGES; COMPUTATIONAL MODEL; DESIGN CONSIDERATIONS; DIRECT OBSERVATION; ENERGETIC PARTICLES; EXPERIMENTAL TECHNIQUES; IN-SITU; IN-SITU TEM; INTERNAL MICROSTRUCTURE; ION BEAM SYSTEM; ION IRRADIATION; IONISATION; NANO SCALE; NUCLEAR ENVIRONMENTS; NUCLEAR MATERIAL; NUCLEAR MATERIALS; PHASE CHANGE; RADIATION-INDUCED; STRUCTURAL CHANGE; TEM; TEM OBSERVATIONS; TRANSMISSION ELECTRON MICROSCOPE; UNITED KINGDOM;

EID: 71849112249     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2009.09.014     Document Type: Article
Times cited : (71)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.