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Volumn 97, Issue 7, 2006, Pages 885-889

Aberration correction in electron microscopy

Author keywords

Aberrations; Corrected electron lenses; Correctors; Electron mirror

Indexed keywords

ABERRATIONS; ELECTROMAGNETIC FIELDS; ELECTRON MICROSCOPY; MIRRORS; OPTICAL RESOLVING POWER;

EID: 33746902811     PISSN: 18625282     EISSN: None     Source Type: Journal    
DOI: 10.3139/146.101316     Document Type: Article
Times cited : (5)

References (13)
  • 3
    • 0002537008 scopus 로고
    • Electron optics of imaging energy filters
    • L. Reimer (Ed.), Springer, Berlin
    • H. Rose, D. Krahl: Electron optics of imaging energy filters, in: L. Reimer (Ed.), Energy-Filtering Electron Microscopy, Springer, Berlin (1995) 43.
    • (1995) Energy-filtering Electron Microscopy , pp. 43
    • Rose, H.1    Krahl, D.2
  • 9
    • 0002685951 scopus 로고
    • H. Rose: Optik 85 (1990) 19.
    • (1990) Optik , vol.85 , pp. 19
    • Rose, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.