|
Volumn 8, Issue 3, 2008, Pages 891-896
|
Toward atomic-scale bright-field electron tomography for the study of fullerene-like nanostructures
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ABERRATIONS;
CHEMICAL ELEMENTS;
DIAGNOSTIC RADIOGRAPHY;
ELECTRIC IMPEDANCE TOMOGRAPHY;
ELECTRONS;
FULLERENES;
LIGHT MEASUREMENT;
MOLYBDENUM;
RESTORATION;
THREE DIMENSIONAL;
TRANSMISSION ELECTRON MICROSCOPY;
ACCELERATION VOLTAGES;
ATOMIC ARCHITECTURES;
ATOMIC LEVELS;
ATOMIC SCALE;
ATOMIC-SCALE RESOLUTIONS;
BRIGHT FIELDS;
CARBON FULLERENES;
ELECTRON CHANNELINGS;
ELECTRON TOMOGRAPHIES;
EXPERIMENTAL DATUM;
FULLERENE-LIKE NANOSTRUCTURES;
FUNCTIONAL NANOPARTICLES;
INORGANIC FULLERENES;
LIGHT ELEMENTS;
LOW-VOLTAGE OPERATIONS;
MOLYBDENUM DISULFIDES;
PHASE-CONTRAST IMAGING;
PHYSICAL SCIENCE;
SINGLE ATOMS;
SPHERICAL ABERRATIONS;
TEM;
THREE-DIMENSIONAL RECONSTRUCTION;
THREE-DIMENSIONAL STRUCTURES;
TOMOGRAPHIC;
TWO-DIMENSIONAL PROJECTIONS;
ATOMS;
FULLERENE DERIVATIVE;
NANOMATERIAL;
ARTICLE;
CHEMICAL STRUCTURE;
CHEMISTRY;
ELECTRON;
TRANSMISSION ELECTRON MICROSCOPY;
ULTRASTRUCTURE;
ELECTRONS;
FULLERENES;
MICROSCOPY, ELECTRON, TRANSMISSION;
MODELS, MOLECULAR;
NANOSTRUCTURES;
|
EID: 43149094691
PISSN: 15306984
EISSN: None
Source Type: Journal
DOI: 10.1021/nl073149i Document Type: Article |
Times cited : (65)
|
References (25)
|