Measuring grain-boundary segregation in nanocrystalline alloys: Direct validation of statistical techniques using atom probe tomography

Philosophical Magazine Letters

Volumn 87, Issue 8, 2007, Pages 581-587

  Detor, A J ^a   Miller, M K ^b   Schuh, C A ^a  

^a Massachusetts Institute of Technology   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN BOUNDARIES; HEAT TREATMENT; SEGREGATION (METALLOGRAPHY); STATISTICAL METHODS;

ATOM PROBE TOMOGRAPHY; GRAIN STRUCTURES; GRAIN-BOUNDARY SEGREGATION; SOLUTE DISTRIBUTION;

NANOCRYSTALLINE ALLOYS;

EID: 34547331302     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/09500830701400125     Document Type: Article

References (14)

1. A.J. Detor and C.A. Schuh, Acta Mater. 55 371 (2007).
2. L.S. Shvindlerman and G. Gottstein, J. Mater. Sci. 40 819 (2005).
3. C.E. Krill, H. Ehrhardt and R. Birringer, Z. Metallkd. 96 1134 (2005).
4. J. Weissmuller, Nanostruct. Mater. 3 261 (1993).
5. R. Kirchheim, Acta Mater. 50 413 (2002).
6. J. Weissmuller, W. Krauss, T. Haubold, et al., Nanostruct. Mater. 1 439 (1992).
7. F. Liu and R. Kirchheim, J. Cryst. Growth 264 385 (2004).
8. B. Färber, E. Cadel, A. Menand, et al., Acta Mater. 48 789 (2000).
9. T. Hentschel, D. Isheim, R. Kirchheim, et al., Acta Mater. 48 933 (2000).
10. M.P. Seah, J. Phys. F 10 1043 (1980).
11. A.J. Detor, M.K. Miller and C.A. Schuh, Phil. Mag. 86 4459 (2006).
12. M.K. Miller, J. Microsc. 186 1 (1997).
13. M. Abraham, P. Holdway, M. Thuvander, et al., Surf. Engng 18 151 (2002).
14. M.K. Miller, A. Cerezo, M.G. Hetherington, et al., Atom Probe Field-Ion Microscopy (Clarendon Press, Oxford, 1996).