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Materials Today

Volumn 7, Issue 12, 2004, Pages 50-55

Aberration correction for TEM

(1) Hetherington, Crispin a

a UNIVERSITY OF OXFORD (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE PROCESSING; IMAGING TECHNIQUES; LENSES; LIGHTING; MONOCHROMATORS; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

ABERRATION CORRECTION; HOLOGRAPHIC TECHNIQUES; SCANNING ATTACHMENT; SCANNING TRANSMISSION ELECTRON MICROSCOPES (STEM);

ABERRATIONS;

EID: 9544239351 PISSN: 13697021 EISSN: None Source Type: Journal
DOI: 10.1016/S1369-7021(04)00571-1 Document Type: Article

Times cited : (29)

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