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Volumn 55, Issue 10, 2007, Pages 3421-3430

Direct determination of elastic strains and dislocation densities in individual subgrains in deformation structures

Author keywords

Copper; Dislocation structure; Line broadening; Plastic deformation; X ray diffraction (XRD)

Indexed keywords

DEFECT DENSITY; ELASTICITY; ELECTRIC CONDUCTIVITY; PLASTIC DEFORMATION; STRAIN; X RAY DIFFRACTION;

EID: 34247648674     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2007.01.049     Document Type: Article
Times cited : (72)

References (32)
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    • Enzo S., and Schiffini L. In: Snyder R.L., Fiala J., and Bunge H.J. (Eds). Defect and microstructure analysis by diffraction. IUCr monographs on crystallography vol. 10 (1999), Oxford University Press, Oxford 29-40
    • (1999) IUCr monographs on crystallography , vol.10 , pp. 29-40
    • Enzo, S.1    Schiffini, L.2
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    • Wilkens M. In: Simmons JA, deWit R, Bullough R, editors. Fundamental aspects of dislocation theory. NBS Special Publication, vol. II, no. 317; 1970, p. 1195-221.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.