Atom probe tomography

Materials Characterization

Volumn 60, Issue 6, 2009, Pages 461-469

  Miller, M K ^a   Forbes, R G ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

Atom probe tomography; Field evaporation; Field ion microcopy

Indexed keywords

DIAGNOSTIC RADIOGRAPHY; EVAPORATION; IONS; PROBES; THREE DIMENSIONAL; TOMOGRAPHY; VAPORS;

ATOM PROBE FIELD ION MICROSCOPES; ATOM PROBE TOMOGRAPHY; ATOMIC LEVELS; FIELD EVAPORATION; FIELD ION MICROCOPY; FREQUENCY DISTRIBUTIONS; MATERIALS CHARACTERIZATIONS; THREE-DIMENSIONAL ATOM PROBES; THREE-DIMENSIONAL DATUM;

ATOMS;

EID: 63349093284     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2009.02.007     Document Type: Short Survey

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