Forward modeling method for microstructure reconstruction using x-ray diffraction microscopy: Single-crystal verification

Review of Scientific Instruments

Volumn 77, Issue 12, 2006, Pages

  Suter, R M ^a   Hennessy, D ^a   Xiao, C ^a   Lienert, U ^b  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BRAGG DIFFRACTED BEAMS; HIGH ENERGY X RAY DIFFRACTION MICROSCOPY; NOISE IMMUNITY; NOISE REDUCTION PROCESSING;

CRYSTAL ORIENTATION; MICROSCOPIC EXAMINATION; NOISE ABATEMENT; SINGLE CRYSTALS; X RAY DIFFRACTION;

MICROSTRUCTURE;

EID: 33846046905     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2400017     Document Type: Article

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