3D electron microscopy in the physical sciences: The development of Z-contrast and EFTEM tomography

Ultramicroscopy

Volumn 96, Issue 3-4, 2003, Pages 413-431

  Midgley, P A ^a   Weyland, M ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Electron tomography; Energy filtered imaging; STEM HAADF imaging; Three dimensional reconstruction

Indexed keywords

MICROELECTRONICS; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

ENERGY FILTERS;

NANOTECHNOLOGY;

ANISOTROPY; ATOM; CONFERENCE PAPER; ELECTRON MICROSCOPY; ELECTRONICS; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; FOURIER ANALYSIS; GEOMETRY; MATERIAL STATE; NANOTECHNOLOGY; NATURAL SCIENCE; OPTICAL RESOLUTION; PARTICLE SIZE; QUANTITATIVE ANALYSIS; TECHNIQUE; THEORY; THREE DIMENSIONAL IMAGING; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; VISUAL FIELD;

EID: 0038641055     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00105-0     Document Type: Conference Paper

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