Imaging physical phenomena with local probes: From electrons to photons

Reviews of Modern Physics

Volumn 84, Issue 3, 2012, Pages 1343-1381

  Bonnell, Dawn A ^a   Basov, D N ^b   Bode, Matthias ^c   Diebold, Ulrike ^d   Kalinin, Sergei V ^e   Madhavan, Vidya ^f   Novotny, Lukas ^g   Salmeron, Miquel ^h   Schwarz, Udo D ⁱ   Weiss, Paul S ^j  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UNIVERSITY OF WÜRZBURG   (Germany)

^d VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^e OAK RIDGE NATIONAL LABORATORY   (United States)

^f BOSTON COLLEGE   (United States)

^g UNIVERSITY OF ROCHESTER   (United States)

^h LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

ⁱ YALE UNIVERSITY   (United States)

^j UNIVERSITY OF CALIFORNIA   (United States)

more..

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MEASUREMENTS; ATOMIC FORCE PROBE; COMPLEX FUNCTIONS; ELECTROMAGNETIC PROPERTIES; ELECTRON SPINS; LOCAL PROBES; MOLECULAR INTERFACES; NANO-METER-SCALE; OPTICAL INTERACTIONS; PHYSICAL PHENOMENA; PLASMON FIELD; PROBE TIPS; REAL-SPACE; SPATIAL RESOLUTION; STRUCTURE OF SURFACES;

ELECTROMECHANICAL COUPLING; ELECTRONIC STRUCTURE; MAGNETIC MOMENTS;

ATOMS;

EID: 84866720470     PISSN: 00346861     EISSN: 15390756     Source Type: Journal    
DOI: 10.1103/RevModPhys.84.1343     Document Type: Article

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