Pushing resolution limits of functional imaging to probe atomic scale properties

ACS Nano

Volumn 2, Issue 9, 2008, Pages 1753-1759

  Bonnell, Dawn ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALES; CHEMICAL PHENOMENON; COMPLEX PROPERTIES; FUNCTIONAL IMAGING; RESOLUTION LIMITS; SPATIAL RESOLUTIONS; VERY HIGH SPATIAL RESOLUTIONS;

CHEMICAL PROPERTIES;

NANOMATERIAL;

ATOMIC FORCE MICROSCOPY; CHEMISTRY; IMAGE ENHANCEMENT; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; REVIEW; ULTRASTRUCTURE;

IMAGE ENHANCEMENT; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; NANOSTRUCTURES; NANOTECHNOLOGY;

EID: 54249130306     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn8005575     Document Type: Article

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