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Volumn 4, Issue 4, 2004, Pages 587-590

Piezoelectric characterization individual zinc oxide nanobelt probed by piezoresponse force microscope

Author keywords

[No Author keywords available]

Indexed keywords

SILICON DIOXIDE; ZINC OXIDE;

EID: 2342507053     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl035198a     Document Type: Article
Times cited : (684)

References (27)
  • 10
    • 2342629530 scopus 로고    scopus 로고
    • U.S. Patent 3,327,584
    • Kissinger, C. D. U.S. Patent 3,327,584.
    • Kissinger, C.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.