Atomic scale Kelvin probe force microscopy studies of the surface potential variations on the TiO2(110) surface

Physical Review Letters

Volumn 100, Issue 23, 2008, Pages

  Enevoldsen, G H ^a   Glatzel, T ^b   Christensen, M C ^a   Lauritsen, J V ^a   Besenbacher, F ^a  

^a AARHUS UNIVERSITY   (Denmark)

^b UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC PHYSICS; ATOMS; CHEMICAL ANALYSIS; IMAGING TECHNIQUES; MICROSCOPES; MICROSCOPIC EXAMINATION; SCANNING PROBE MICROSCOPY; SURFACE PROPERTIES; SURFACES;

(1 1 0) SURFACE; AMERICAN PHYSICAL SOCIETY (APS); ATOMIC SCALES; CHARGED STATES; CHEMICAL IDENTITY; CONTACT-POTENTIAL-DIFFERENCE (CPD); CROSS SECTION ANALYSIS; ELECTRONIC SURFACE; INDIVIDUAL (PSS 544-7); KELVIN PROBE FORCE MICROSCOPY (KPFM); NON-CONTACT ATOMIC FORCE MICROSCOPY (NC-AFM); POTENTIAL VARIATIONS; SURFACE ATOMS; SURFACE SPECIES; TIO2 (RUTILE);

SURFACE POTENTIAL;

EID: 45249096710     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.100.236104     Document Type: Article

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