Nanoscale investigation of fatigue effects in Pb(Zr,Ti)O3 films

Applied Physics Letters

Volumn 69, Issue 21, 1996, Pages 3191-3193

  Gruverman, A ^a   Auciello, O ^b   Tokumoto, H ^a  

^a NATL INST FOR ADV INTERDISC RES   (Japan)

^b MCNC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000144490     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117957     Document Type: Article

References (13)

1. See, for example, Science and Technology of Electroceramic Thin Films, edited by O. Auciello and R. Waser, NATO/ARW Series E, Vol. 284 (Kluwer, Dordrecht, The Netherlands, 1994).
2. R. Luthi, H. Haefke, K.-P. Meyer, E. Meyer, L. Howald, and H.-J. Guntherodt, J. Appl. Phys. 74, 7461 (1993).
3. M.-K. Bae, T. Horiuchi, K. Hara, Y. Ishibashi, and K. Matsushige, Jpn. J. Phys. 33, 1390 (1994).
4. K. Franke, J. Besold, W. Haessler, and C. Seegebarth, Surf. Sci. Lett. 302, L283 (1994).
5. A. Gruverman, O. Auciello, J. Hatano, and H. Tokumoto, Ferroelectrics 184, 11 (1996).
6. A. Gruverman, O. Auciello, and H. Tokumoto, J. Vac. Sci. Technol. B 14, 602 (1996).
7. H. Birk, J. Glatz-Reichenback, L. Jie, E. Schreck, and K. Dransfeld, J. Vac. Sci. Technol. B 9, 1162 (1991).
8. P. Guthner and K. Dransfeld, Appl. Phys. Lett. 61, 1137 (1992).
9. K. Takata, J. Appl. Phys. 79, 134 (1996).
10. O. Auciello, A. R. Krauss, and K. D. Gifford, in Ferroelectric Thin Films: Synthesis and Properties, edited by C. A. Paz de Araujo, J. F. Scott, and G. W. Taylor (Gordon and Breach, New York, 1996).
11. J. F. Scott, Imeg. Ferroelectrics 9, 1 (1995).
12. J. F. Scott and B. Pouligny, J. Appl. Phys. 64, 1547 (1988).
13. A. L. Kholkin, E. L. Colla, A. K. Tagantsev, D. V. Taylor, and N. Setter, Appl. Phys. Lett. 68, 2577 (1996).