Sublattice identification in scanning force microscopy on alkali halide surfaces

Physical Review Letters

Volumn 92, Issue 14, 2004, Pages

  Hoffmann, R ^a,b   Kantorovich, L N ^c   Baratoff, A ^a   Hug, H J ^a,d   Guntherodt H J ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

^b UNIVERSITY OF KARLSRUHE   (Germany)

^c KING'S COLLEGE LONDON   (United Kingdom)

^d SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CANTILEVER BEAMS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; ELECTRIC INSULATORS; FILM GROWTH; HALIDE MINERALS; IMAGE ANALYSIS; OPTIMIZATION; POLARIZATION; POSITIVE IONS; SILICON; SPUTTERING; THERMAL EFFECTS;

ATOMISTIC SIMULATION; ROCKSALT STRUCTURES; SCANNING FORCE MICROSCOPY (SFM); SEMIEMPIRICAL POTENTIALS;

ALKALI METALS;

EID: 2542454901     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.92.146103     Document Type: Article

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