Scanned probe imaging of single-electron charge states in nanotube quantum dots

Science

Volumn 296, Issue 5570, 2002, Pages 1098-1101

  Woodside, Michael T ^a   McEuen, Paul L ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTANCE; ELECTRIC POTENTIAL; ELECTRONIC DENSITY OF STATES; ELECTROSTATICS; IMAGING TECHNIQUES; NANOTUBES; OSCILLATIONS; PROBES;

SCANNED PROBE IMAGING;

SEMICONDUCTOR QUANTUM DOTS;

ELECTRON; SCANNING ELECTRON MICROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRON; FORCE; MOTION; OSCILLATION; PRIORITY JOURNAL;

EID: 0037052453     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.1069923     Document Type: Article

References (28)