Role of Single Defects in Electronic Transport through Carbon Nanotube Field-Effect Transistors

Physical Review Letters

Volumn 89, Issue 21, 2002, Pages

  Freitag, Marcus ^a   Johnson, A T ^a   Kalinin, Sergei V ^b   Bonnell, Dawn A ^b  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBES; DEFECTS; ELECTRON TRANSITIONS; FERMI LEVEL; MICROSCOPIC EXAMINATION; VOLTAGE DISTRIBUTION MEASUREMENT;

HIGH-RESOLUTION IMAGING;

FIELD EFFECT TRANSISTORS;

EID: 0037132268     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.89.216801     Document Type: Article

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