Chemical identification of individual surface atoms by atomic force microscopy

Nature

Volumn 446, Issue 7131, 2007, Pages 64-67

  Sugimoto, Yoshiaki ^a   Pou, Pablo ^b   Abe, Masayuki ^a,c   Jelinek, Pavel ^d   Pérez, Rubén ^b   Morita, Seizo ^a   Custance, Óscar ^a  

^a OSAKA UNIVERSITY   (Japan)

^b UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^d INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

LEAD; SILICON; TIN;

ALLOY; ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; IDENTIFICATION METHOD;

ARTICLE; ATOM; ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; CHEMICAL FORCE MICROSCOPY; CHEMICAL STRUCTURE; IMAGING; MEASUREMENT; PERFORMANCE; PRIORITY JOURNAL; ROOM TEMPERATURE; SURFACE PROPERTY;

EID: 33847402040     PISSN: 00280836     EISSN: 14764687     Source Type: Journal    
DOI: 10.1038/nature05530     Document Type: Article

References (26)

1. Eigler, D. M. & Schweizer, E. K. Positioning single atoms with a scanning tunnelling microscope. Nature 344, 524-526 (1990).
2. Sugimoto, Y. et al. Atom inlays performed at room temperature using atomic force microscopy. Nature Mater. 4, 156-159 (2005).
3. Stipe, B. C., Rezaei, M. A. & Ho, W. Single-molecule vibrational spectroscopy and microscopy. Science 280, 1732-1735 (1998).
4. Heinrich, A. J., Lutz, C. P., Gupta, J. A. & Eigler, D. M. Molecule cascades. Science 298, 1381-1387 (2002).
5. Pascual, J. I., Lorente, N., Song, Z., Conrad, H. & Rust, H.-P. Selectivity in vibrationally mediated single-molecule chemistry. Nature 423, 525-528 (2003).
6. Madhavan, V., Chen, W., Jamneala, T., Crommie, M. F. & Wingreen, N. S. Tunneling into a single magnetic atom: spectroscopic evidence of the Kondo resonance. Science 280, 567-569 (1998).
7. Li, J., Schneider, W.-D., Berndt, R. & Delley, B. Kondo scattering observed at a single magnetic impurity. Phys. Rev. Lett. 80, 2893-2896 (1998).
8. Morita, S., Wiesendanger, R. & Meyer, E. Noncontact Atomic Force Microscopy. NanoScience and Technology (Springer, Berlin, 2002).
9. García, R. & Pérez, R. Dynamic atomic force microscopy methods. Surf. Sci. Rep. 47, 197-301 (2002).
10. Giessibl, F. J. Advances in atomic force microscopy. Rev. Mod. Phys. 75, 949-983 (2003).
11. Lantz, M. A. et al. Quantitative measurement of short-range chemical bonding forces. Science 291, 2580-2583 (2001).
12. Abe, M., Sugimoto, Y., Custance, O. & Morita, S. Room-temperature reproducible spatial force spectroscopy using atom-tracking technique. Appl. Phys. Lett. 87, 173503 (2005).
13. Hoffmann, R., Kantorovich, L. N., Baratoff, A., Hug, H. J. & Güntherodt, H.-J. Sublattice identification in scanning force microscopy on alkali halide surfaces. Phys. Rev. Lett. 92, 146103 (2004).
14. Pérez, R., Payne, M., Štich, I. & Terakura, K. Role of covalent tip-surface interactions in noncontact atomic force microscopy. Phys. Rev. Lett. 78, 678-681 (1997).
15. Livshits, A. I., Shluger, A. L., Rohl, A. L. & Foster, A. S. Model of noncontact scanning force microscopy on ionic surfaces. Phys. Rev. B 59, 2436-2448 (1999).
16. Abe, M., Sugimoto, Y., Custance, O. & Morita, S. Atom tracking for reproducible force spectroscopy at room temperature with non-contact atomic force microscopy. Nanotechnology 16, 3029-3034 (2005).
17. Oyabu, N. et al. Single atomic contact adhesion and dissipation in dynamic force microscopy. Phys. Rev. Lett. 96, 106101 (2006).
18. Ke, S. H., Uda, T., Pérez, R., Štich, I. & Terakura, K. First-principles investigation of tip-surface interaction on a GaAs(110) surface: implications for atomic force and scanning tunneling microscopies. Phys. Rev. B 60, 11631-11638 (1999).
19. Hembacher, S., Giessibl, F. J. & Mannhart, J. Force microscopy with light-atom probes. Science 305, 380-383 (2004).
20. Sugimoto, Y. et al. Real topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: The case of the α-Sn/Si(111)-(√3 × √3)R30° surface. Phys. Rev. B 73, 205329 (2006).
21. Sugimoto, Y. et al. Non-contact atomic force microscopy study of the Sn/Si(111) mosaic phase. Appl. Surf. Sci. 241, 23-27 (2005).
22. Charrier, A. et al. Contrasted electronic properties of Sn-adatom-based (√3 × √3)R30° reconstructions on Si(111). Phys. Rev. B 64, 115407 (2001).
23. Albrecht, T. R., Grütter, P., Horne, D. & Rugar, D. Frequency modulation detection using high-Q cantilevers for enhanced force microscope sensitivity. J. Appl. Phys. 69, 668-673 (1991).
24. Giessibl, F. J. Forces and frequency shifts in atomic resolution dynamic-force microscopy. Phys. Rev. B 56, 16010-16015 (1997).
25. Sader, J. E. & Jarvis, S. P. Accurate formulas for interaction force and energy in frequency modulation force spectroscopy. Appl. Phys. Lett. 84, 1801-1803 (2004).
26. Jelinek, P., Wang, H., Lewis, J. P., Sankey, O. F. & Ortega, J. Multicenter approach to the exchange-correlation interactions in ab initio tight-binding methods. Phys. Rev. B 71, 235101 (2005).