Atomic resolution imaging and frequency versus distance measurements on NiO(001) using low-temperature scanning force microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 67, Issue 8, 2003, Pages

  Hoffmann, R ^a,c   Lantz, M A ^b   Hug, H J ^a   van Schendel, P J A ^a   Kappenberger, P ^a   Martin, S ^a   Baratoff, A ^a   Güntherodt, H J ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

^b IBM RESEARCH ZURICH   (Switzerland)

^c MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

NICKEL COMPLEX; NICKEL MONOXIDE; UNCLASSIFIED DRUG;

ARTICLE; ATOM; CRYSTAL STRUCTURE; FORCE; IMAGE RECONSTRUCTION; LOW TEMPERATURE; MAGNETISM; MEASUREMENT; MODEL; RADIOISOTOPE DECAY; SCANNING FORCE MICROSCOPY; SIGNAL PROCESSING;

EID: 0037304449     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.67.085402     Document Type: Article

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