Imaging and control of domain structures in ferroelectric thin films via scanning force microscopy

Annual Review of Materials Science

Volumn 28, Issue 1, 1998, Pages 101-123

  Gruverman, Alexei ^a,b   Auciello, Orlando ^c   Tokumoto, Hiroshi ^d  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^b SONY CORPORATION   (Japan)

^c ARGONNE NATIONAL LABORATORY   (United States)

^d NATL INST FOR ADV INTERDISC RES   (Japan)

Author keywords

Ferroelectric domains; Nanofabrication; Piezoelectricity

Indexed keywords

CRYSTAL STRUCTURE; ELECTRIC CHARGE; ELECTRIC FIELD EFFECTS; FERROELECTRIC MATERIALS; MICROSCOPIC EXAMINATION; NANOTECHNOLOGY; NONDESTRUCTIVE EXAMINATION; PIEZOELECTRICITY; THIN FILMS;

FERROELECTRIC DOMAINS; SCANNING FORCE MICROSCOPY;

DIELECTRIC FILMS;

EID: 0031619828     PISSN: 00846600     EISSN: None     Source Type: Journal    
DOI: 10.1146/annurev.matsci.28.1.101     Document Type: Article

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