Probing physical properties at the nanoscale

Physics Today

Volumn 61, Issue 6, 2008, Pages 36-42

  Brukman, Matthew J ^a   Bonnell, Dawn A ^b  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 47849123257     PISSN: 00319228     EISSN: None     Source Type: Trade Journal    
DOI: 10.1063/1.2947647     Document Type: Article

References (12)

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