Quantitative determination of tip parameters in piezoresponse force microscopy

Applied Physics Letters

Volumn 90, Issue 21, 2007, Pages

  Kalinin, Sergei V ^a   Jesse, Stephen ^a   Rodriguez, Brian J ^a   Eliseev, Eugene A ^b   Gopalan, Venkatraman ^c   Morozovska, Anna N ^d  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b FRANTSEVICH INSTITUTE FOR PROBLEMS OF MATERIALS SCIENCE   (Ukraine)

^c PENNSYLVANIA STATE UNIVERSITY   (United States)

^d INSTITUTE OF SEMICONDUCTOR PHYSICS   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

LINEAR IMAGING; PIEZORESPONSE FORCE MICROSCOPY; POINT CHARGE;

ELECTRODES; FORCE MEASUREMENT; IMAGING SYSTEMS; MATHEMATICAL MODELS; PARAMETER ESTIMATION;

DOMAIN WALLS;

EID: 34249741077     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2742900     Document Type: Article

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