Piezoresponse force microscopy for piezoelectric measurements of III-nitride materials

Journal of Crystal Growth

Volumn 246, Issue 3-4, 2002, Pages 252-258

  Rodriguez, B J ^a   Gruverman, A ^a   Kingon, A I ^a   Nemanich, R J ^a  

^a North Carolina State University   (United States)

Author keywords

A1. Atomic force microscopy; B2. Piezoelectric materials; B2. Semiconducting III V materials

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALS; HETEROJUNCTIONS; PIEZOELECTRIC MATERIALS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM COMPOUNDS; THIN FILMS;

PIEZOELECTRIC CONSTANTS;

VAPOR PHASE EPITAXY;

EID: 0037121636     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(02)01749-9     Document Type: Conference Paper

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