Nanoscale imaging of surface piezoresponse on GaN epitaxial layers

Applied Surface Science

Volumn 253, Issue 9, 2007, Pages 4300-4306

  Stoica, T ^a   Calarco, R ^a   Meijers, R ^a   Luth H ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Gallium nitride; Molecular beam epitaxy; Piezoresponse; Scanning probe techniques

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC POTENTIAL; IMAGE ANALYSIS; MOLECULAR BEAM EPITAXY; PIEZOELECTRICITY; SURFACE PHENOMENA; SURFACE TREATMENT;

EPITAXIAL LAYERS; PIEZO IMAGING; PIEZOELECTRIC FORCE MICROSCOPY; SCANNING PROBE TECHNIQUES; SURFACE CHARGING;

GALLIUM NITRIDE;

EID: 33846809159     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.09.039     Document Type: Article

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