Scanning probe microscopes go video rate and beyond

Review of Scientific Instruments

Volumn 76, Issue 5, 2005, Pages

  Rost, M J ^a,b   Crama, L ^a   Schakel, P ^a   Van Tol, E ^a   Van Velzen Williams, G B E M ^a   Overgauw, C F ^a   Ter Horst, H ^c   Dekker, H ^c   Okhuijsen, B ^c   Seynen, M ^c   Vijftigschild, A ^c   Han, P ^d   Katan, A J ^a   Schoots, K ^a   Schumm, R ^a   Van Loo, W ^a   Oosterkamp, T H ^a   Frenken, J W M ^a  

^a LEIDEN UNIVERSITY   (Netherlands)

^b Leiden Probe Microscopy BV (LPM)   (Netherlands)

^c FOM INSTITUTE AMOLF   (Netherlands)

^d PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL CONVERTERS; ERROR SIGNALS; MECHANICAL RESONANCE; SCANNING PROBE MICROSCOPES (SPM);

ATOMIC FORCE MICROSCOPY; DNA; ERROR ANALYSIS; FEEDBACK CONTROL; IMAGING SYSTEMS; NATURAL FREQUENCIES; SCANNING TUNNELING MICROSCOPY; ULTRAHIGH VACUUM;

CONTROL SYSTEM ANALYSIS;

EID: 20844463224     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1915288     Document Type: Article

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