Data acquisition and analysis procedures for high-resolution atomic force microscopy in three dimensions

Nanotechnology

Volumn 20, Issue 26, 2009, Pages

  Albers, Boris J ^a   Schwendemann, Todd C ^a   Baykara, Mehmet Z ^a   Pilet, Nicolas ^a   Liebmann, Marcus ^a,b   Altman, Eric I ^a   Schwarz, Udo D ^a  

^a Yale University   (United States)

^b RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

3D DATA; A-PLANE; ACQUISITION TIME; ATOMIC FORCE FIELD; ATOMIC RESOLUTION; ATTRACTIVE REGION; CANTILEVER OSCILLATION; DATA SETS; DRIFT CORRECTION; ENERGY FIELDS; HIGH QUALITY; HIGH RESOLUTION; HIGHLY ORIENTED PYROLYTIC GRAPHITE; IMAGE DATA ACQUISITION; LOW TEMPERATURES; MEASUREMENT TIME; NONCONTACT ATOMIC FORCE MICROSCOPY; PICO-NEWTON FORCE; REDUNDANT INFORMATIONS; SAMPLE SURFACE; SURFACE NORMALS; THREE DIMENSIONS; THREE-DIMENSIONAL (3D) SURFACES; TIP-SAMPLE FORCES; UNIT CELLS; VERTICAL RESOLUTION;

ATOMIC FORCE MICROSCOPY; ATOMS; GRAPHITE; IMAGE RECORDING; MERGERS AND ACQUISITIONS; TWO DIMENSIONAL; VACUUM;

THREE DIMENSIONAL;

GRAPHITE;

ARTICLE; ATOMIC FORCE MICROSCOPY; ENERGY; FORCE; IMAGE ANALYSIS; IMAGE QUALITY; INFORMATION PROCESSING; LOW TEMPERATURE; OSCILLATION; PRIORITY JOURNAL; THREE DIMENSIONAL IMAGING; VACUUM;

EID: 67649321927     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/26/264002     Document Type: Article

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